NANOPARTICLE MEASUREMENTS

Nanotechnology has emerged and been hailed as the next industrial revolution. However, the occupational health risks of using or manufacturing nanoparticles are not clearly understood. Subsequently, workers may be exposed to these nanoparticles through means of inhalation at levels that greatly exceed ambient concentrations. TSI makes a variety of instruments for toxicologists and industrial hygienists to measure the total number concentration and surface area of nanoparticles.

 


RELATED NEWS

TSI CREATES THE SOLUTION FOR ULTRAFINE PARTICLE MONITORING — March 7, 2008-  TSI Incorporated has developed the first real solution to monitoring how ultrafine particles can affect our air quality. Ultrafine particles take away more than our vision; they can affect our health as well. TSI offers the solution: Model 3031 Ultrafine Particle Monitor – Simple, long term, maintenance free, remotely managed monitoring of ultrafine particles in our air.TSI'S ULTRAFINE PARTICLE COUNTER IS CHOICE OF DNREC'S NANOPARTICLE STUDY — November 20, 2009 - TSI’sUltrafine Particle Counter (3031) is the instrument of choice for a new study conducted by Delaware’s Department of Natural Resources and Environmental Control’s Division of Air Quality Management for its ability to continuously monitor and count airborne nanoparticles- a growing health concern for many- for several size ranges. TSI ANNOUNCES 2010 SEMINARS AND WEBINARS FOR RESEARCH AND ANALYTIC APPLICATIONS — February 17, 2010- TSI Incorporated will once again offer a wide range of educational and networking opportunities for researchers in the fields of aerosol science and fluid mechanics to participate in throughout 2010.  In particular, TSI experts will host a running series of seminars and webinars aimed at providing ongoing professional development, information on the latest measurement solutions, and additional system training. TSI also hopes that such events will serve as a forum for more in-depth scientific discussions and idea sharing among researchers. TSI LAUNCHES NEW ENVIRONMENTAL PARTICLE COUNTER MODEL 3783 — UNIVERSITY OF MINNESOTA AND TSI OFFER 35TH ANNUAL AEROSOL AND PARTICLE MEASUREMENT SHORTCOURSE —  

RELATED EVENTS

November 25, 2010 –
November 28, 2010
Siberian Aerosol Conference 2010
University Tomsk, Russia
Visit TSI at the Show

RELATED PROMOTIONS

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APPLICATION NOTES

 Electrostatic Classifier Model 3080 Optional Positive High Voltage Power Supply (3080-001)
 Electrostatic Classifier Model 3080 Optional Positive High Voltage Power Supply (3080-001)
 Emissions Monitoring Freeway Monitoring Performing Aerosol Science in Harm’s Way (EM-002)
 Emissions Monitoring Freeway Monitoring Performing Aerosol Science in Harm’s Way (EM-002--A4)
 Emissions Monitoring University of Minnesota Mobile Emission Laboratory (EM-001)
 Emissions Monitoring University of Minnesota Mobile Emission Laboratory (EM-001--A4)
 Environmental Monitoring Rocket Science Applied to Air Pollution in the Developing World (ENV-001)
 Environmental Monitoring Rocket Science Applied to Air Pollution in the Developing World (ENV-001--A4)
 Measuring Nanoparticle Exposure (ITI-101)
 Measuring Nanoparticle Exposure (ITI-101)
 Measuring Nanoparticle Exposure (NSAM-001)
 Measuring Nanoparticle Size Distributions in Real-Time: Key Factors for Accuracy (SMPS-003)
 Measuring Nanoparticle Size Distributions in Real-Time: Key Factors for Accuracy (SMPS-003-A4)
 Model 378x-PC Water-based Condensation Particle Counter Access and Use the PC/104 Single Board Computer (SBC) (WCPC-001)
 Model 378x-PC Water-based Condensation Particle Counter Access and Use the PC/104 Single Board Computer (SBC) (WCPC-001--A4)
 Nano Technology_Sampling and Conditioning Application Note
 Nanotechnology--An Emerging Industrial Hygiene Issue (ITI-098)
 Real-Time Measurement of Nanoparticle Size Distributions using Electrical Mobility Technique (SMPS-004)
 Real-Time Measurement of Nanoparticle Size Distributions using Electrical Mobility Technique (SMPS-004-A4)
 Scanning Mobility Particle Sizer (SMPS) Spectrometer Diffusion Loss Correction (SMPS-001)
 Scanning Mobility Particle Sizer (SMPS) Spectrometer Diffusion Loss Correction (SMPS-001-A4)
 Scanning Mobility Particle Sizer (SMPS) Spectrometer Nanoparticle Aggregate Mobility Analysis Software Module (SMPS-002)
 Scanning Mobility Particle Sizer (SMPS) Spectrometer Nanoparticle Aggregate Mobility Analysis Software Module (SMPS-002-A4)

BIBLIOGRAPHY

 Applications
 Basic Research and Nucleation Studies
 Bibliography - SMPS
 Combustion and Emissions
 Filter Test
 Indoor Air, Exposure Monitoring, and Inhalation Toxicology
 Instrument Characterization
 Nanotechnology
 Outdoor Air
 SMPS Design, Characterization, Sampling Techniques and History

BROCHURES

 AEROTRAK 9000 Nanoparticle Aerosol Monitor
 TSI Knows Nano

CATALOGS

 Particle Instruments Catalog

INSTALLATION INSTRUCTIONS

 TRAKPRO™ Data Analysis Software

MANUALS

 AeroTrak 9000

POSTERS

 Material Effects on Threshold Counting Efficiency

SPEC SHEETS

 Model 3007
 Model 3007 (A4)
 Model 3550
 Model 3775
 Model 3775 (A4)
 Model 3776
 Model 3776 (A4)
 Model 3783 EPC™ monitor
 Model 3785
 Model 3785 (A4)
 Model 3786
 Model 3786 (A4)

TECHNICAL NOTES

 Nanotechnology--Evolving occupational safety, health and environmental issues, by Emory E. Knowles III (posted with permission of ASSE from the March 2006 issue of Professional Safety)
 Nanotechnology--is there a cause for concern? by Brian McShane (posted with permission of ASSE from the March 2006 issue of Professional Safety)
 Small Wonders, Big Questions...Nanotechnology by Jim Parsons (posted with permission of AIHA from the October 2004 issue of The Synergist)